microform
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Title
Antireflecting-chromium Linewidth Standard, Srm 475, For Calibration Of Optical Microscope Linewidth Measuring Systems
Call No
C 13.10:260-117
Authors
Subjects
Language
English
Published
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Springfield, VA : Order from National Technical Information Service], 1992.
Publication Desc
xi, 37 p. : ill. ;
Series
Dimensions
28 cm.