microform
|
The Certification Of 100 Mm Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements
-- Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Copies
1 Total copies, 1 Copies are in,
0 Copies are out.
- Share It:
Title
The Certification Of 100 Mm Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements -- Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Call No
C 13.48/4:260-131
Edition
1999 ed.
Authors
Language
English
Published
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1999.
Publication Desc
vi, 106 p. : ill.
Series
