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The Certification Of 100 Mm Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements
-- Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
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Title
The Certification Of 100 Mm Diameter Silicon Resistivity Srms 2541 Through 2547 Using Dual-configuration Four-point Probe Measurements -- Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements
Call No
C 13.48/4:260-131
Edition
1999 ed.
Authors
Language
English
Published
Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 1999.
Publication Desc
vi, 106 p. : ill.
Series